The Effects of X-Ray Irradiation on MAS Diodes
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- 社団法人応用物理学会の論文
- 1972-07-05
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関連論文
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- Damage Introduced by Second Breakdown in N-Channel MOS Devices
- Surface State Generation in MOS Structure by Applying High Field to the SiO_2 Film
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- Influence of Al_2O_3 Deposition Temperature on Charge-Storage and Retention in MA(O)S Structures
- The Effect of Electrode on the C-V Hysteresis Behavior of MAS and MAOS Structures
- Physical and Chemical Properties of Aluminum Oxide Film Deposited by AlCl_3-CO_2-H_2 System
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