Partial Charge Accumulation of MAOS Structures
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概要
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- 社団法人応用物理学会の論文
- 1972-07-05
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関連論文
- An Instability of MAOS Structures
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- The Effects of X-Ray Irradiation on MAS Diodes
- Influence of Al_2O_3 Deposition Temperature on Charge-Storage and Retention in MA(O)S Structures
- The Effect of Electrode on the C-V Hysteresis Behavior of MAS and MAOS Structures
- The Effects of Heat Treatment on the Interface Characteristics in the Si-Al_2O_3 and Si-SiO_2-Al_2O_3 Systems
- Physical and Chemical Properties of Aluminum Oxide Film Deposited by AlCl_3-CO_2-H_2 System
- Partial Charge Accumulation of MAOS Structures