磁気力顕微鏡によるパターンおよびグラニュラー垂直媒体中の保磁力分布の解析

概要

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A dot-by-dot magnetic force microscopy (MFM) analysis method was developed to study the magnetization reversal process of individual particles in dot arrays with perpendicular magnetic anisotropy. The coercivity H_c of each dot is measured by in-situ MFM while applying a perpendicular magnetic field, and the spatial distribution of the coercive force is then derived. By using atomic force microscopy (AFM) to simultaneously measure the 3-dimensional size of dots, the intrinsic coercive force distribution can also be obtained by subtracting the contributions of the shape anisotropy and inter-particle magnetostatic interaction from the experimental results. Dot-by-dot MFM analysis was also applied to a CoCrPt-SiO_2 perpendicular medium and revealed its nano-scale H_c distribution in the medium.
社団法人日本磁気学会の論文
2004-07-01