Single Crystal Elastic Constants of β-Silicon Nitride Determined by X-Ray Powder Diffraction

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The X-ray elastic constants of pressureless sintered β-silicon nitride (Si_3N_4), were experimentally determined for ten different diffractions by using Kα radiations of Cu, Co, Fe, Cr and V.The X-ray compliances, (1+v′_X)E′_X and v′_X/E′_X(E′_X=Young's modulus, v′_X=Poisson's ratio), change as a second power function of cos^2φ(φ=angle between the diffraction plane normal and the c-axis of hexagonal crystal).Using the simplex method, the elastic constants of single crystals of β-silicon nitride were determined from the measured values of the X-ray compliances on the basis of the average of Voigt and Reuss models and Kroner's model, combined with the self-consistent analysis of multi-phase materials.The obtained result shows a high stiffness in the c-direction of hexagonal crystals, but the degree of anisotropy is not so large as the whisker data reported by Hay et al.
社団法人日本材料学会の論文
2000-12-15