OS8(1)-2(OS08W0100) Advanced Structural Design and Evaluation in Synergy Ceramics
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概要
- 論文の詳細を見る
- 一般社団法人日本機械学会の論文
- 2003-09-09
著者
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Kawamoto Hiroshi
Synergy Ceramics Laboratory Fine Ceramics Research Association
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Sakaida Y
Dept. Of Mechanical Engineering Shizuoka Univ.
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Nagano Yasuo
Synergy Ceramics Laboratory, Fine Ceramics Research Association
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Sakaida Yoshihisa
Dept. of Mechanical Engineering, Shizuoka Univ.
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Sakaida Yoshihisa
Dept. Of Mechanical Engineering Shizuoka Univ.
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Nagano Yasuo
Synergy Ceramics Laboratory Fine Ceramics Research Association
関連論文
- GS(P)-45(GSW0451) Fatigue Crack Propagation in PZT under Mechanical and Electrical Loadings
- OS8(4)-17(OS08W0404) Microscopic Observation Near Fatigue Crack Tip in Piezoelectric Ceramics by Atomic Force Microscopy and Synchrotron X-ray Diffraction
- OS8(2)-8(OS08W0126) Grain Level Modeling and Simulations of Crack Propagation in Polycrystalline Ceramics
- OS8(1)-2(OS08W0100) Advanced Structural Design and Evaluation in Synergy Ceramics
- X-Ray Study on Lattice Strain and Domain Switching Induced in Rhombohedral PZT by Poling and External Loading
- Deformation and Fracture of Piezoelectric Ceramics(Student Poster Session)
- Local Stress Measurement in Notched Sapphire by Raman Microspectroscopy
- Single Crystal Elastic Constants of β-Silicon Nitride Determined by X-Ray Powder Diffraction
- Lattice Strain and Domain Switching Induced in Tetragonal PZT by Poling and Mechanical Loading
- X-ray Study of Residual Stress Distribution of Ground Ceramics
- Analysis of Stress Gradient in Ceramic Film by X-ray Method
- OS8(2)-7(OS08W0101) Image-Based Modeling with High Resolution X-Ray CT for Porous Alumina and Elastic Analysis with Homogenization Method
- OS8(1)-4(OS08W0217) Development of Strain Evaluation Method Using Micro-Focus X-Ray Beam
- Development of a Strain Evaluation Technique Using a Micro Focus X-ray Beam
- OS8(1)-5(OS08W0215) Estimation of Elastic Modulus of Polycrystalline Ceramics Using Microstructural Grain Model
- OS8(1)-3(OS08W0163) Measurement of Lattice Defect and Local Strain in Polished Sapphire by Transmission Electron Microscopy
- Strain Evaluation for Sapphire Using a Microfocus X-ray Diffraction System