Local Stress Measurement in Notched Sapphire by Raman Microspectroscopy

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概要

• 論文の詳細を見る

• A new system of Raman microspectroscopy was developed to measure the residual stress in a local area with about 2 μm diameter in ceramics.The system was applied to a single crystal sapphire in order to evaluate the capability of the system.The shift of two Raman spectra, 645 and 418 cm, ^-1, of A_1g mode was proportional to the lattice strain, ε_33, along the c-axis of trigonal crystals.The proportional constant was larger for 418 cm^-1 than for 645 cm^-1 spectrum.The distributions of loading strains due to four-point bending were measured across the minimum ligament of single-edge-notched specimens by scanning the focused Ar^+ laser beam.The strain concentration near the notch root was successfully detected by Raman microspectroscopy.The measured distributions of strains agreed very well with the results of a finite element analysis.The developed system of Raman microspectroscopy was applicable to the strain measurement in the area having a steep gradient as observed near the crack tip in ceramics.

• 社団法人日本材料学会の論文
• 2000-12-15

著者

• TANAKA Keisuke

  Department of Mathematical and Computing Sciences, Tokyo Institute of Technology

• Tanaka Keisuke

  Department Of Cardiovascular Surgery Nagoya Daini Red Cross Hospital

• Sakaida Y

  Dept. Of Mechanical Engineering Shizuoka Univ.

• Shirakihara Kaori

  JSPS Research Fellow, Japan Fine Ceramics Center

• SHIRAKIHARA Kaori

  Graduate School, Department of Mechanical Engineering, Nagoya University

• SAKAIDA Yoshihisa

  Synergy Ceramics Laboratory, Fine Ceramics Research Association

• Tanaka Keisuke

  Department Of Applied Chemistry Waseda University

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