Key Generation for Fast Inversion of the Paillier Encryption Function
スポンサーリンク
概要
- 論文の詳細を見る
We study fast inversion of the Paillier encryption function. Especially, we focus only on key generation, and do not modify the Paillier encryption function. We propose three key generation algorithms based on the speeding-up techniques for the RSA encryption function. By using our algorithms, the size of the private CRT exponent is half of that of Paillier-CRT. The first algorithm employs the extended Euclidean algorithm. The second algorithm employs factoring algorithms, and can construct the private CRT exponent with low Hamming weight. The third algorithm is a variant of the second one, and has some advantage such as compression of the private CRT exponent and no requirement for factoring algorithms. We also propose the settings of the parameters for these algorithms and analyze the security of the Paillier encryption function by these algorithms against known attacks. Finally, we give experimental results of our algorithms.
著者
-
HIRANO Takato
Department of Mathematical and Computing Sciences, Tokyo Institute of Technology
-
TANAKA Keisuke
Department of Mathematical and Computing Sciences, Tokyo Institute of Technology
関連論文
- Key Generation for Fast Inversion of the Paillier Encryption Function
- High Space-Resolutive Evaluation of Subsurface Stress Distribution by Strain Scanning Method with Analyzer Using High-Energy Synchrotron X-Rays(Macro-, Micro-, Meso-, and Nano-scopic Strength of Materials Relating to Microstructures)
- 2P-278 シアノバクテリアの青色光受容タンパク質SyPixDの構造変化の時間分解検出(光生物・視覚,光受容(2),第46回日本生物物理学会年会)
- 3P276 青色光センサータンパク質PixDとレスポンスレギュレーターPixEのタンパク質問相互作用の時間分解観測(光生物-視覚・光受容,第48回日本生物物理学会年会)
- X-Ray Study of Mechanical Properties of TiN Thin Films Coated on Steel by Ion Beam Mixing Method
- X-Ray Study of Mechanical Properties of TiN Films Coated on Steel by Ion Beam Mixing(Thin Films)
- X-Ray Stress Measurement of Hexagonal Polycrystals with[001]Fiber Texture
- Shuffle for Paillier's Encryption Scheme(Discrete Mathematics and Its Applications)
- 1P-222 青色光センサータンパク質PixDの光誘起構造変化および分子間相互作用変化の研究(光生物-視覚・光受容,第47回日本生物物理学会年会)
- 1P-061 光センサータンパク質TePixDの反応ダイナミクスへの圧力効果(蛋白質-機能(反応機構,生物活性など),第47回日本生物物理学会年会)
- Fatigue Mechanisms of Porous Silicon Carbide under Cyclic Loading(Ceramics & Rocks 1)
- Primitive Power Roots of Unity and Its Application to Encryption
- Schemes for Encryption with Anonymity and Ring Signature(Public Key Cryptography, Cryptography and Information Security)
- Neutron Diffraction Study of Thermal Residual Stress in Ceramic Composite
- Less Invasive Surgical Closure of Patent Ductus Arteriosus in Extremely Low Birth Weight Infants
- Successful Repair of Supravalvular Aortic Stenosis with Ostial Stenosis of the Left Coronary Artery using Brom's Three Patch Technique
- Detection Rates of TT Virus DNA in Serum of Umbilical Cord Blood, Breast Milk and Saliva
- 3P087 青色光受容BLUFタンパク質TePixDの光反応生成物の決定(蛋白質-機能(反応機構,生物活性など),第48回日本生物物理学会年会)
- NEAR-THRESHOLD PROPAGATION OF DELAMINATION FATIGUE CRACKS IN UNIDIRECTIONAL CF/PEEK LAMINATES IN AIR AND IN WATER
- DS-1-1 Variations on Pseudo-Free Groups
- Recovery of postural stability following conscious sedation with midazolam in the elderly
- Roles of Cation and Anion Molecules in Ferridistortive Phase Transition in [A(CH_3)_4]_2XBr_4 Type Crystals
- Key Generation for Fast Inversion of the Paillier Encryption Function
- Fatigue Strength Evaluation of Cracked Components
- X-Ray Study on Lattice Strain and Domain Switching Induced in Rhombohedral PZT by Poling and External Loading
- Deformation and Fracture of Piezoelectric Ceramics(Student Poster Session)
- Local Stress Measurement in Notched Sapphire by Raman Microspectroscopy
- Single Crystal Elastic Constants of β-Silicon Nitride Determined by X-Ray Powder Diffraction
- Lattice Strain and Domain Switching Induced in Tetragonal PZT by Poling and Mechanical Loading
- Elastic Constants and X-Ray Stress Measurement of Cubic Thin Films with Fiber Texture
- X-Ray Measurement of Residual Stress in Patterned Aluminum Thin Films Sputtered on Silicon Wafers
- A Multi-Trapdoor Commitment Scheme from the RSA Assumption
- An Efficient Non-interactive Universally Composable String-Commitment Scheme