PENETRATION DEPTH OF X-RAYS FOR STRESS MEASUREMENT OF SILICON NITRIDE

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概要

• 論文の詳細を見る
• 社団法人日本材料学会の論文
• 1995-06-15

著者

• Suzuki Kenji

  Faculty Of Education Niigata University

• Suzuki Kenji

  Faculty Of Agriculture Yamaguchi University

• Tanaka Keisuke

  Faculty Of Engineering Nagoya University

• Tanaka Keisuke

  Faculty Of Engineering Kyoto University

関連論文

• Videosonde Observations during the R/V Mirai MR04-08 Cruise
• Single Crystal Elastic Constants of β-Silicon Nitride Determined by X-Ray Powder Diffraction
• X-ray Study of Residual Stress Distribution of Ground Ceramics
• Analysis of Stress Gradient in Ceramic Film by X-ray Method
• Effect of Grinding Method on Bending Strength of Silicon Nitride
• Prediction of Propagation and Nonpropagation of Short Fatigue Cracks at Notches Under Mean Stresses
• Preparation and Properties of Nanosized Biodegradable Polymer Capsules
• PENETRATION DEPTH OF X-RAYS FOR STRESS MEASUREMENT OF SILICON NITRIDE
• Prediction of Fracture Strength of Ceramics with Small Defects Based on R-Curve Method
• Online Continuous Scale Estimation of Hand Gestures

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