Raman Scattering from Anisotropic Phonon Modes in SiC Polytypes

概要

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Frequency difference between planar and axial type modes in transverse opticalphonons has been studied in various SiC polytypes by Raman scattering. The degreeof the anisotropy in the phonon frequency is closely correlated with percent of thehexagonal stacking in polytypes. It is confirmed experiment;ally that the proportional-ity between the anisotropy and hexagonality holds for all the polytypes identified byX-ray analysis. The calculation under the assumption that the interplanar force cons-Cant differs for hexagonal and cubic environments has explained this relationship.These results suggest that the hexagonality of unidentified polytypes with longerperiod can be determined from Raman measurements of' the anisotropy. Opticalphonons in 20-SiC have also been examined and their ft'equencies have been ob-tained.
社団法人日本物理学会の論文
1987-09-15