Structural Identification of SiC Polytypes by Raman Scattering:27R and 33R Polytypes
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概要
- 論文の詳細を見る
Raman scattering spectra of SiC polytypes 27R and 33R have been measured with aback scattering geometry using a (0001) face. The relative Raman intensities of foldedmodes in transverse acoustic (TA) and transverse optic (TO) branches have beencalculated with the aid of a linear chain model. The calculated Raman profile for eachbranch agrees semi-quantitatively with the observed spectrum. The result indicatesthat the Raman intensity analysis of the folded modes can be used to identify thepolytype of SiC with longer period.
- 社団法人日本物理学会の論文
- 1987-01-15
著者
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NAKASHIMA Shin-ichi
Department of Applied Physics,Osaka University
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NAKAKURA Yasuhiro
Department of Applied Physics,Osaka University
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INOUE Zenzaburo
National Institute for Research in Inorganic Materials
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Inoue Z
National Institute For Research In Inorganic Materials
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Nakashima Shin-ichi
Department Of Applied Physics Faculty Of Engineering Osaka University
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Nakakura Y
Osaka Univ. Suita Jpn
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Nakakura Yasuhiro
Department Of Applied Physics Osaka University
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