Lifetime Measurements of Minority Carriers in Deuteron Irradiated Germanium Crystals
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概要
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Minority carrier lifetimes were measured on the deuteron irradiated surfaces of n-type germanium crystals. Fictitiously long lifetimes were obtained which suggest the formation of a p-type thin layer by the deuteron irradiation. Etch figures were observed on the irradiated surfaces.
- 社団法人日本物理学会の論文
- 1957-12-05
著者
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Hasiguti Ryukiti
Department Of Metallurgy University Of Tokyo
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Hasiguti Ryukiti
Department Of Mechanical Engineering Faculty Of Engineering The Science University Of Tokyo
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Matsuura Etsuyuki
Department Of Metallurgy University Of Tokyo
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ISHlNO Shiori
Department of Metallurgy, University of Tokyo
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Ishlno Shiori
Department Of Metallurgy University Of Tokyo
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