多値パターン投影による3次元形状測定(第3報) : 自己参照パターン投影法

概要

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The profile measurement system using time sequential space encoding with multi-gray code patterns has been developed. However, some objects which have colored surfaces and the unevenness of reflectivity could not be measured using this method. Therefore the reference projection images are added to the system. By the reference projection image method, the colored plaster figures under the normal illumination could be measured by comparing objected space coding images with the reference images. However, the number of projections increased from that of the conventional binary space code projection method. In this paper, the novel space code encoding system, the self-referenced pattern projection method, was introduced. This method reduces the number of projections and keeps the features of the previous method. Using this system, the measuring space is coded into n! spaces with the n projections which has the n gray levels. It is shown that the number of projection of this method is the least in normal projection situations.
公益社団法人精密工学会の論文
1998-02-05