A Low-Noise Amplifier for WCDMA Terminal with High Tolerance for Leakage Signal from Transmitter
スポンサーリンク
概要
- 論文の詳細を見る
Since a receiver (RX) and a transmitter (TX) are operated simultaneously in a WCDMA transceiver, noise and intermodulation distortion performances of a low-noise amplifier (LNA) are degraded by a large leakage signal from the TX. The degradation of the distortion due to the large leakage signal from the TX has been reported in some previous works, but to our best knowledge, there are no reports about the degradation of noise figure (NF) in a LNA due to the large leakage signal from the TX. In this paper, a 900-MHz LNA for WCDMA terminal with high tolerance for a leakage signal from the TX is proposed. Suitable designs of an input matching circuit and a trap circuit are adopted to improve the tolerance for the leakage signal from the TX. The LNA using the proposed techniques is fabricated using SiGe-BiCMOS process. The measured degradation of NF due to the leakage signal from the TX is suppressed to only 0.12dB.
- （社）電子情報通信学会の論文
- 2008-02-01
著者
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TOYODA Takehiko
Toshiba Corp.
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TSURUMI Hiroshi
Toshiba Corp.
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Fujimoto R
Toshiba Corp. Kawasaki‐shi Jpn
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Fujimoto Ryuichi
Toshiba Corp. Yokohama‐shi Jpn
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Fujimoto Ryuichi
Semiconductor Company Toshiba Corp.
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Tsurumi H
Toshiba Corp. Kawasaki‐shi Jpn
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Tsurumi Hiroshi
Toshiba Corp. Kawasaki‐shi Jpn
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TAKEMURA Gaku
Semiconductor Company, Toshiba Corp.
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ISHII Masato
Semiconductor Company, Toshiba Corp.
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TOYODA Takehiko
Semiconductor Company, Toshiba Corp.
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TSURUMI Hiroshi
Semiconductor Company, Toshiba Corp.
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Takemura Gaku
Semiconductor Company Toshiba Corp.
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Tanimoto Hiroshi
The Corporate Research & Development Center Toshiba Corporation:(present Address) The Department
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Ishii Masato
Semiconductor Company Toshiba Corp.
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Tanimoto H
Toshiba Corp. Kawasaki‐shi Jpn
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Tsurumi Hiroshi
Semiconductor Company Toshiba Corp.
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