Comparison of Threshold Voltage Fluctuations in Sub-45nm Planar MOSFET and Thin-Buried-Oxide SOI Devices
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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Li Yiming
Department Of Communication Engineering National Chiao Tung University
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Yu Shao-ming
Department Of Computer And Information Science National Chiao Tung University
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Yu Shao-ming
Department Of Computer Science National Chiao Tung University
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