A Novel Statistical Methodology for Sub-100nm MOSFET Fabrication Optimization and Sensitivity Analysis
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概要
- 論文の詳細を見る
- 2005-09-13
著者
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Chou Ying-shao
Microelectronics And Information Systems Research Center National Chiao Tung University
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Li Yiming
Department Of Communication Engineering National Chiao Tung University
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