Four-dimensional dielectric property image obtained from electron spectroscopic imaging series
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 2001-11-13
著者
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Kai J‐j
National Tsing‐hua Univ. Hsinchu Twn
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Chen F‐r
National Tsing‐hua Univ. Hsinchu Twn
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Chen Fu-rong
Department Of Engineering And System Science National Tsing-hua University
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Chang Li
Department Of Materials Science And Engineering National Chiao-tung University Hsinchu
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Lo Shen-chuan
Department Of Engineering And System Science National Tsing-hua University Hsinchu
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Chang Li
Department Of Chemical Engineering National Cheng Kung University
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Chen Li-chien
Department Of Engineering And System Science National Tsing-hua University Hsinchu
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Kai Ji-jung
Department Of Engineering And System Science Center For Electron Microscopy National Tsing-hua Unive
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CHIANG Cheng-Cheng
Department of Engineering and System Science, National Tsing-Hua University HsinChu
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DING Peijun
Applied Materials, Santa Clara
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CHIN Barry
Applied Materials, Santa Clara
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ZHANG Hong
Applied Materials, Santa Clara
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CHEN Fusen
Applied Materials, Santa Clara
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Chin Barry
Applied Materials Santa Clara
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Ding Peijun
Applied Materials Santa Clara
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Chiang Cheng-cheng
Department Of Engineering And System Science National Tsing-hua University Hsinchu
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Chen Fu-rong
Department Of Engineering And System Science Center For Electron Microscopy National Tsing-hua Unive
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Zhang Hong
Applied Materials Santa Clara
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