Atomic structure observation of silicon carbide using HRTEM

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文

著者

• Chen F‐r

  National Tsing‐hua Univ. Hsinchu Twn

• Chen Fu-rong

  Department Of Engineering And System Science National Tsing-hua University

• Takuma E

  Univ. Tokyo Tokyo Jpn

• Ichinose H

  Department Of Materials Science Faculty Of Engineering University Of Tokyo

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• Structural Disorder and Optical Property of InGaAsN Alloy Semiconductor (小特集テーマ:進展する窒化物半導体光・電子デバイスの現状,及び一般)
• A Structural Study of Co-Sb Multilayered Film by X-Ray Diffraction
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• Bandgap mapping for III-V quantum well by electron spectroscopy imaging
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• Extension of HRTEM resolution by semi-blind deconvolution method and Gerchberg-Saxton algorithm : application to grain boundary and interface
• Mapping of sp^2/sp^3 in DLC thin film by signal processed ESI series energy-loss image
• Atomic structure observation of silicon carbide using HRTEM
• Atomic structure observation of silicon carbide using HRTEM

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