Effect of Structural Properties on Electrical Properties of Lanthanum Oxide Thin Film as a Gate Dielectric
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-06-15
著者
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CHOI Doo
Department of Ceramic Engineering, Yonsei University
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Hwang Chul
Jusung Engineering
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JUN Jin
Department of Ceramic Engineering, Yonsei University
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Oh Ki
Jusung Engineering Co. Ltd.
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KIM Keung
Division of Ceramics, Korea Institute of Science and Technology
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