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Toray Research Center Inc. | 論文
- Measurement of Elastic Constants of Ceramics by a Scanning Laser Acoustic Microscope
- IMMUNOHISTOCHEMISTRY OF THE DISTRIBUTION OF α-TUBULIN IN RAT-INCISOR ODONTOBLASTS AND AMELOBLASTS
- Characterization of Low-k Interconnect Dielectrics by EELS
- Nano-meter order Structures of Porous Low-k Films and their Impacts on Cu/Low-k Processes
- Characterization of Crystalline Defects and Stress in Shallow Trench Isolation by Cathodoluminescence and Raman Spectroscopies
- Purification and Primary Structure of C-1027-AG, a Selective Antagonist of Antitumor Antibiotic C-1027, from Streptomyces globisporus(Biological Chemistry)
- Process-Induced Damage Characterization of Patterned Low-$\kappa$ Film Using Electron Energy Loss Spectroscopy Technique
- Kramers-Kronig Analysis of a-Si/SiNx Interface Structure
- Hole Donors in the High-T_c Phase of a Bi-Pb-Sr-Ca-Cu Oxide Superconductor
- Observation of the High-T_c Phase and Determination of the Pb Position in a Bi-Pb-Sr-Ca-Cu Oxide Superconductor
- RECONSTITUTION OF PROTEASE-TREATED 33kDa PROTEINS WITH CYANOBACTERIAL, RED ALGAL AND HIGHER PLANT PSII
- Detection of DNA Damage Induced by Space Radiation in Mir and Space Shuttle
- Purification and Characterization of Lipid Bioflocculant Produced by Rhodococcus erythropolis
- 固体高分子形燃料電池に用いられる白金担持カーボンの白金触媒三次元分布
- Study on Adsorption Behavior of Organic Contaminations on Silicon Surface by Gas Chromatography/Mass Spectrometry
- Cathodoluminescence Microcharacterization of Radiative Recombination Centers in Lifetime-Controlled Insulated Gate Bipolar Transistors
- Viscoelastic Behavior of Scarcely Crosslinked Poly(dimethyl siloxane) Gels: 2. Effects of Sol Component and Network Strand Length
- High Pressure Oxygen Treatment and the Substitution of Sr for Ba on (Nd_Ba_)_2(Ce_Nd_)_2Cu_3O_y Superconductor
- Formation of Bi-Pb-Sr-Ca-Cu Oxide Superconducting Layer from Alkoxide Solutions
- In Situ Observation of Native Oxide Growth on a Si(100) Surface Using Grazing Incidence X-Ray Reflectivity and Fourier Transform Infrared Spectrometer : Semiconductors