Kramers-Kronig Analysis of a-Si/SiNx Interface Structure
スポンサーリンク
概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1995-10-01
著者
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Otsuka Yuji
Toray Research Center Inc.
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Houjou Hirohiko
Toray Reserch Center Inc. Morphological Laboratory
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TANII Yoshiharu
Toray Reserch Center, Inc., Morphological Laboratory
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HINOSHITA Chiaki
Toray Reserch Center, Inc., Morphological Laboratory
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HORII Seiichirou
Toray Reserch Center, Inc., Morphological Laboratory
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MURATA Yukio
Toray Reserch Center, Inc., Morphological Laboratory
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Horii Seiichirou
Toray Reserch Center Inc. Morphological Laboratory
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Hinoshita Chiaki
Toray Reserch Center Inc. Morphological Laboratory
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Otsuka Yuji
Toray Reserch Center Inc. Morphological Laboratory
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Tanii Y
Toray Res. Center. Inc Otsu Jpn
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Murata Yukio
Toray Reserch Center Inc. Morphological Laboratory
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- Kramers-Kronig Analysis of a-Si/SiNx Interface Structure
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