スポンサーリンク
The Authors Are With The Graduate School Of Information Science Nara Institute Of Science And Techno | 論文
- Fault-Tolerant and Self-Stabilizing Protocols Using an Unreliable Failure Detector
- MAP and LogMAP Decoding Algorithms for Linear Block Codes Using a Code Structure(Special Section on Information Theory and Its Applications)
- Duplicated Hash Routing:A Robust Algorithm for a Distributed WWW Cache System(Special Issue on Next Generation Internet Technologies and Their Applications)
- A DFT Selection Method for Reducing Test Application Time of System-on-Chips(SoC Testing)(Test and Verification of VLSI)
- A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint(Test)(Dependable Computing)
- A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint
- Design for Two-Pattern Testability of Controller-Data Path Circuits
- Analyzing Path Delay Fault Testability of RTL Data Paths:A Non-Scan Approach (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
- Analyzing Path Delay Fault Testability of RTL Data Paths: A Non-Scan Approach (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
- Delay Fault Testing of Processor Cores in Functional Mode(Dependable Computing)
- Wait-Free Linearizable Distributed Shared Memory
- Parallel Algorithms for the All Nearest Neighbors of Binary Image on the BSP Model
- High-Level Synthesis for Weakly Testable Data Paths(Special Issue on Test and Diagnosis of VLSI)
- A Simple Parallel Algorithm for the Medial Axis Transform (Special Issue on Architectures Algorithms and Networks for Massively parallel Computing)
- An Analysis of WWW Server Status by Packet Monitoring(Special Issue on Next Generation Internet Technologies and Their Applications)
- A Non-scan DFT Method at Register-Transfer Level to Achieve 100% Fault Efficiency (特集:システムLSIの設計技術と設計自動化)
- Non-scan Design for Testability for Synchronous Sequential Circuits Based on Fault-Oriented Conflict Analysis(Fault Tolerance)
- Non-scan Design for Testability for Synchronous Sequential Circuits Based on Fault-Oriented Conflict Analysis
- Relations among Security Goals of Frobabilistic Public-Key Cryptosystems : Special Section on Cryptography and Information Security
- Efficient Recognition Algorithms for Parallel Multiple Context-Free Languages and for Multiple Context-Free Languages