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TOSHIBA CORPORATION | 論文
- Highly Reliable MOS Trench Gate FET by Oxygen Radical Oxidation
- Improved J-E Characteristics and Stress Induced Leakage Currents (SILC) in Oxynitride Films Grown at 400℃ by Microwave-Excited High-Density Kr/O_2/NH_3 Plasma
- Ultra-Thin Silicon Oxynitride Film Grown at Low-Temperature by Microwave-Excited High-Density Kr/O_2/N_2 Plasma
- Ultra-Thin Silicon Oxynitride Films as Cu Diffusion Barrier for Lowering Interconnect Resistivity
- High-Integrity Silicon Oxide Grown at Low-Temperature by Atomic Oxygen Generated in High-Density Krypton Plasma
- Low-Temperature Formation of Silicon Nitride Film by Direct Nitridation Employing High-Density and Low-Energy Ion Bombardment
- Ultra-Low-Temperature Formation of Si Nitride Film by Direct Nitridation Employing High-Density and Low-Energy Ion Bombardment
- Impact Strength of Steel Plates Struck by Projectiles : Effect of Mechanical Properties on Critical Fracture Energy
- Modeling of Body Factor and Subthreshold Swing in Short Channel Bulk MOSFETs
- Mobility Increase in High-Ns Region in (110)-Oriented UTB pMOSFET Through Surface Roughness Improvement
- A Driving Test of a Small DC Motor with Rectenna Array
- Long-life Water Cooled Small Reactor with U-Np-Pu Fuel
- Very Sharp Room-Temperature Negative Differential Conductance in Silicon Single-Hole Transistor with High Voltage Gain
- Temperature Dependence of Off-Current in Bulk and FD SOI MOSFETs
- Serum Creatinine on Admission Predicts Long-Term Mortality in Acute Myocardial Infarction Patients Undergoing Successful Primary Angioplasty : Data From the Heart Institute of Japan Acute Myocardial Infarction (HIJAMI) Registry
- New α-Particle Induced Soft Error Mechanism in a Three Dimensional Capacitor Cell
- ICONE11-36297 ANALYSIS OF THE THERMAL HYDRAULICS AND CORE DEGRADATION BEHAVIOR IN THE PHEBUS-FPT1 TEST TRAIN WITH IMPACT/SAMPSON CODE
- Development of Molten Core Relocation Analysis Module MCRA in the Severe Accident Analysis Code SAMPSON
- 画像処理技術の適用による原子力発電プラントの監視技術 (画像処理・解析技術)
- Joule Loss on a Faraday Shield of JT-60 ICRF Test Antenna : Nuclear Science, Plasmas and Electric Discharges