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Research Center for Integrated Systems, Hiroshima University | 論文
- Valence Band Alignment at Ultra-Thin SiO_2/Si(111) Interfaces as Determined by High-Resolution X-Ray Photoelectron Spectroscopy
- Valence Band Alignment at Ultra-Thin SiO_2/Si(111) Interfaces as Determined by High-Resolution X-Ray Photoelectron Spectroscopy
- Effects of Hydrogen and Bias on Single-Crystal Al Growth on Vicinal Si by DC Magnetron Sputtering
- Design of Optically Coupled Three-Dimensional Content Addressable Memory
- Control of Fine Particulate and Gaseous Contaminants by UV/Photoelectron Method (Special Issue on Scientific ULSI Manufacturing Technology)
- Coupled Monte Carlo-Energy Relaxation Analysis of Hot Carrier Light Emission in Metal Oxide Semiconductor Field Effect Transistor's
- Two-Dimensional Device Simulator VENUS-2D/B for Amorphous Silicon Thin-Film Transistors Using a Gap-State Model
- A Semi-Analytical Approach to Compute the Decay of Optically Generated Carriers in Silicon Wafer
- Device Simulation with Quasi Three-Dimensional Temperature Analysis for Short-Channel Poly-Si Thin-Film Transistor
- Low-Temperature Operation of Polycrystalline Silicon Thin-Film Transistors
- Early Stages of Oxidation of Clean Si(111)-7x7 and Si(100)-2x1 Surfaces Studied by In-Situ High Resolution X-Ray Photoelectron Spectroscopy
- Liquid Phase Immunoassay Using Magnetic Markers and Superconducting Quantum Interference Device
- Size Distribution of Magnetic Marker Estimated from AC Susceptibility in Solution for Biosensor Application
- Determination of Chemical Shifts in Si2p Core-Level Spectra for Silicon-Hydrogen Bonds on Chemically-Cleaned Su(100) and Si(111) Surfaces
- Non von Neumann Chip Architecture Present and Future (Special Issue on New Architecture LSIs)
- Influence of Sputtering Geometry on Crystallinity of Al(110) Thin Films on Offset (100)Si
- A Concept of Analog-Digital Merged Circuit Architecture for Future VLSI's (Special Section on Analog Technologies in Submicron Era)
- The Valence Band Alignment at Ultra-Thin SiO_2/Si(100) Interfaces Determined by High-Resolution X-Ray Photoelectron Spectroscopy
- High-Rate GaAs Epitaxial Lift-Off Technique for Optoelectronic Integrated Circuits
- Optically Interconnected Kohonen Net for Pattern Recognition