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Fujitsu Ltd. | 論文
- Scaling Trends and Mitigation Techniques for Soft Errors in Flip-Flops
- Comparison of Defect Formation in InGaAsP/InP and GaAlAs/GaAs : B-2: LD AND LED-1
- A Language for System Programs and Its Implementation Using a Macro Processor
- 0.1μm-Gate InGaP/InGaAs HEMT Technology for Millimeter Wave Applications(Special Issue on Microwave and Millimeter-Wave Module Technology)
- Quantum-Dot Semiconductor Optical Amplifiers
- [Invited]Quantum-Dot Semiconductor Optical Amplifiers
- Detection of characteristic signals from As-doped (
- Time-Dependent Airborne Organic Contaimination on Silicon Wafer Surface Stored in a Plastic Box
- Novel Self-Switching Optical Gate Device with Internal Model-Locked Pulses
- 電子プローブを用いた構造・物性解析手法の開発と応用 (特集 地域と世界に貢献する東北大学多元物質科学研究所)
- Scaling Law for Secondary Cosmic-Ray Neutron-Induced Soft-Errors in DRAMs
- Impact of Current Gain Increment Effect on Alpha Particle Induced Soft Errors in SOI DRAMs
- Theoretical Study of Alpha-Particle-Induced Soft Errors in Submicron SOI SRAM (Special Issue on ULSI Memory Technology)
- First-Principles Study of Electronic Properties in Si Lattice Matched SiGeC Alloy with a Low C Concentration
- Power Dependence on Repetition Time of the Q-Switched CO_2 Laser
- Dependence of Rocking Curve for Thin In_Ga_xAs_P_y Layer on Thickness in a Symmetric Bragg Case
- Single-Electron Transistor with Ultra-High Coulomb Energy of 5000K Using Position Controlled Grown Carbon Nanotube as Channel
- Novel Soft Error Hardened Latches and Flip-Flops
- Neutron-induced Soft-Error Simulation Technology for Logic Circuits
- Evaluation of (Pb, La)(Zr, Ti)O_3 (PLZT) Capacitors of Different Film Thicknesses with Pt/SrRuO_3 Top Electrodes