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Department Of Electronics And Informatics Ryukoku University | 論文
- 二段階遷移混合分布型HMM
- Polymorphisms in PTCH1 Affect the Risk of Ameloblastoma
- Extraction Technique of Trap Density at Grain Boundaries in Polycrystalline-Silicon Thin-Film Transistors with Device Simulation
- Classification of Driving Methods for TFT-OLEDs and Novel Proposal Using Time Ratio Grayscale and Current Uniformization(Electronic Displays)
- 表側と裏側の絶縁膜界面にトラップ準位をもつポリシリコン薄膜トランジスタのデバイスシミュレーション(ディスプレイ-IDW'03関連-)
- Extraction of Trap Densities at Front and Back Interfaces in Thin-Film Transistors
- Poly-Si TFT特性の酸化膜界面トラップと結晶粒界トラップに対する依存性およびその製造プロセス診断への応用(半導体Si及び関連材料・評価)
- Numerical Model of Thin-Film Transistors for Circuit Simulation Using Spline Interpolation with Transformation by y=x + log(x)(Regular Section)
- 多結晶シリコン薄膜トランジスタの絶縁膜-シリコン界面と結晶粒界のトラップ準位の抽出(低温または高温多結晶Siとアクティブマトリックス型ディスプレイ用薄膜トランジスタ論文特集)
- 多結晶シリコン薄膜トランジスタの特性解析とシミュレーション
- 多結晶シリコン薄膜トランジスタの特性解析とシミュレーション
- Extraction of Trap States at the Oxide-Silicon Interface and Grain Boundary for Polycrystalline Silicon Thin-Film Transistors : Semiconductors
- Energy Transfer in Light-Harvesting Small Dendrimers Having π-Conjugated Aromatic Rings
- Information Shared System with Comments in Ad-Hoc Network at a Mall
- Device Simulation of Carrier Transport through Grain Boundaries in Lightly Doped Polysilicon Films and Dependence on Dopant Density : Semiconductors
- Current Paths over Grain Boundaries in Polycrystalline Silicon Films : Semiconductors
- Determination of the Anisotropic Refractive Indices of Twisted Nematic Liquid Crystals by Means of Renormalized Transmission Ellipsometry : Instrumentation, Measurement, and Fabrication Technology
- Artificial Dielectric Resonator Made of Spherical Metal Particles
- Suzaku Observations of Hercules X-1 : Measurements of the Two Cyclotron Harmonics
- Driving-Voltage Reduction of Electrostatically Tunable Infrared Filter