スポンサーリンク
Department Of Electrical Engineering National Cheng Kung University | 論文
- Current Density-Voltage Characteristics of AC Thin-Film Electroluminescent Devices with Different Dielectric-Phosphor Interfaces
- Effects of Insulating Layers and Active Layer on ZnS:Tb, F Thin-Film Electroluminescent Devices
- Effects of [H_2S]/[DMZn] Molar Ratio on ZnS Films Grown by Low-Pressure Metalorganic Chemical Vapor Deposition
- High Dielectric Constant of RF-Sputtered HfO_2 Thin Films
- Temperature-Dependent Characteristics of the Inverted Delta-Doped V-Shaped InGaP/In_xGa_/GaAs Pseudomorphic Transistors
- Investigation of a Step-Doped-Channel Negative-Differential-Resistance Transistor
- Structural and Optical Studies of ZnCdSe/ZnSe/ZnMgSSe Separate Confinement Heterostructures with Different Buffer Layers
- The δ-Doped In_Ga_As/GaAs Pseudomorphic High Electron Mobility Transistor Structures Prepared by Low-Pressure Metal Organic Chemical Vapor Deposition
- Enhancement of Electron Emission Characteristics of Platform-shaped Mo Emitters by Diamond-like Carbon Coatings
- Noise Analysis of Nitride-based MOS-HFETs with Photo-chemical Vapor Deposition SiO_2 Gate Oxide in the Linear and Saturation Region
- Homoepitaxial ZnSe MIS Photodetectors Using SiO_2 and BST Insulator
- The annealing effects of GaN MIS capacitors with photo-CVD oxide layers
- Effects of Redox Treatment on Diamondlike Carbon Coated Mo Substrates
- A Tempo-Based t-out-of-n Audio Cryptography Scheme (Information Security)
- DYNAMIC SHEAR MODULUS AND EVOLUTION OF FABRIC OF GRANULAR MATERIALS
- A Study of Aging Treatment on the Mg-10Li-0.5Zn Alloy
- Influences of Interface Roughness Scattering on Asymmetric and/or Steplike Current-Voltage Characteristics of Resonant Tunneling Diodes
- Runx2, Osx, and Dspp in Tooth Development
- An Improved In_Ga_P/GaAs Double Heterostructure-Emitter Bipolar Transistor Using Emitter Edge-Thinning Technique
- Application of Doping-Superlattice Collector Structure for GaAs Bipolar Transistor