Influences of Interface Roughness Scattering on Asymmetric and/or Steplike Current-Voltage Characteristics of Resonant Tunneling Diodes
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-07-15
著者
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YEH Mei-Ling
Department of Electronic Engineering, St. John's & St. Mary's Institute of Technology
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LIOU Wan-Rone
Department of Electrical Engineering, National Taiwan Ocean University
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Wang S‐j
National Chiao Tung Univ. Hsinchu Twn
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Wang Shui-jinn
Microelectronics Laboratory Department Of Electrical Engineering National Cheng Kung University
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Yeh Mei-ling
Department Of Electronic Engineering St. John's & St. Mary's Institute Of Technology
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Liou W‐r
Department Of Electrical Engineering National Taiwan Ocean University
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Luo Ying-che
Department Of Electrical Engineering National Cheng Kung University
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Cheng Ching-yuan
Department Of Electrical Engineering National Cheng Kung University
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Yeh Mei-ling
Department Of Electrical Engineering National Taiwan Ocean University
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Liou Wan-rone
Department Of Electrical Engineering The National Taiwan Ocean University
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LIN Jia-Chuan
Microelectronics Laboratory, Department of Electrical Engineering, National Cheng Kung University
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LUO Ying-Che
Microelectronics Laboratory, Department of Electrical Engineering, National Cheng Kung University
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CHENG Ching-Yuan
Microelectronics Laboratory, Department of Electrical Engineering, National Cheng Kung University
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Lin Jia-chuan
Department Of Electrical Engineering National Cheng Kung University
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Lin Jia-chuan
Microelectronics Laboratory Department Of Electrical Engineering National Cheng Kung University
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