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Central Research laboratory, Hitachi Ltd. | 論文
- Degradation Characteristics of Ga_Al_xAs Visible Diode Lasers : B-3: LASER
- A 270-MHz CMOS Quadrature Modulator for a GSM Transmitter(Special Section on Analog Circuit Techniques and Related Topics)
- MBE-Related Surface Fegregation of Dopant Atoms in Silicon : Condensed Matter
- Short Channel MOS FET's Fabricated by Self-Aligned Ion Implantation and Laser Annealing : A-3: LASER ANNEALING/SOS DEVICES
- Depth Profiling of Hydrogen Implanted into Magnetic Bubble Garnet Films Using the ^1H(^N, αγ)^C Reaction
- Characterization of InGaP/GaAs Heterojunction Bipolar Transistors with a Heavily Doped Base : Semiconductors
- Fully Strained Heavily Carbon-Doped GaAs Grown by Gas-Source Molecular Beam Epitaxy Using Carbontetrabromide and Its Application to InGaP/GaAs Heterojunction Bipolar Transistors
- A WSi Base Electrode and a Heavily-Doped Thin Base Layer for High-Speed and Low-Power InGaP/GaAs HBTs
- Fully Strained Heavily Carbon-Doped GaAs Using Carbontetrabromide by Gas-Source Molecular Beam Epitaxy and Its Application in InGaP/GaAs Heterojunction Bipolar Transistors
- New Technologies of a WSi Base Electrode and a Heavily-Doped Thin Base Layer for High-Performance InGaP/GaAs HBTs
- Aluminum-Line Cutting End-Monitor Utilizing Scanning-Ion-Microscope Voltage-Contrast Images
- Observation of Surface Micro-Structures by Micro-Probe Reflection High-Energy Electron Diffraction
- Excess Noise in Amorphous Selenium Avalanche Photodiodes
- Amorphous Channel SESO Memory with Good Logic Process Compatibility for Low-power High-density Embedded RAM
- Roles of Surface Functional Groups on TiN and SiN Substrates in Resist Pattern Deformations
- Investigation of Resist Pattern Deformation in Chemical Amplification Resists on SiN_x Substrates
- Characterization of One-Dimensional Conduction in an Ultra-Thin Poly-Si Wire
- Effects of Dislocation on Planar Channelling of Energetic H^+ and He^+ Ions
- Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
- Hydrogen-related Degradation and Recovery Phenomena in Pb(Zr,Ti)O_3 Capacitors with a Platinum Electrode