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Central Research Laboratory, Hitachi Lid. | 論文
- Amorphous-Se/GaAs : A Novel Heterostructure for Solid-State Devices
- Read/Write Characteristics and Micromagnetic Recorded Structure of Co-Alloy Thin Film Media
- Development of EXAFS Spectrometer and Structural Characterization of Amorphous Silicon
- Investigation of the Si Oxidation Process by XANES Spectroscopy Using Synchrotron Radiation
- Micro-Probe Reflection High-Energy Electron Diffraction Technique. : III. Observation of Polycrystalline Silicon Film on Crystalline Silicon Substrate Irradiated by Continuous-Wave Ar^+-Laser
- Generalized Bethe Potential in Reflection Electron Diffraction
- Effect of Tl and Metallic Element Addition to In-Se Based Phase-change Optical Recording Film : MEDIA
- Studies of NH_3 Thermal Nitridation of Ultrathin Si-Oxide Films on Si using Photoemission Spectroscopy with Synchrotron Radiation
- Estimation of the Thickness of Ultrathin Silicon Nitride Films by X-Ray Photoelectron Spectroscopy
- Surface Analysis of LaB_6 Single Crystal Thermionic Emitters
- Mobility-Lifetime Product in Hydrogenated Amorphous Silicon
- Characterization of Laser-Induced Epitaxial Si Crystal by Evaluating MOSFET's Fabricated in Grown Layers : A-6: SILICON CRYSTALS
- Integrated Radiation Detectors with a-Si Photodiodes on Ceramic Scintillators
- Direct Observation of a-Si:H/a-Si_C_x:H Multilayers and Their Electrical Properties : Surfaces, Interfaces and Films
- Preparation of High Purity a-Si:H Films and Their Light Soaking Effects
- Observation of Surface Micro-Structures by Micro-Probe Reflection High-Energy Electron Diffraction
- Dielectric Properties of Ferroelectric Rb_2ZnBe_4
- Differential Thermal Analysis Using a Ge-Ag Thermocouple under Hydrostatic Pressure : Phase Behavior of {N(CH_3)_4}_2MnCl_4
- Precise Mark Shape Control in Mark Length Recording on Magnetooptical Disk
- Read Channel and Format for High-Density Magneto-Optical Disk System