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Central Research Institute Mitsubishi Materials Corporation | 論文
- Effect of Grinding on the Coercivity of MnBi Particles
- Single-Domain Properties in MnBi Particles
- Proximity Gettering of Heavy Metals by High-Energy Ion Implantation
- Study of Transmittance of Polymers and Influence of Photoacid Generator on Resist Transmittance at Extreme Ultraviolet Wavelength
- Measurement of Resist Transmittance at Extreme Ultraviolet Wavelength Using the Extreme Ultraviolet Reflectometer(Instrumentation, Measurement, and Fabrication Technology)
- Superconducting Bi_2Sr_2Ca_1Cu_2O_ Glass-Ceramics with Different Melting Histories
- Quantitative Analysis of Surface Contaminations on Si Wafers by Total Reflection X-Ray Fluorescence
- Ultrasonic Properties of Lead Zirconate Titanate Thin Films in UHF-SHF Range
- Measurement of Organic Matter on Si Wafer by Thermal Desorption Spectroscopy
- Growth of Native Oxide and Accumulation of Organic Matter on Bare Si Wafer in Air
- Study of Si Etch Rate in Various Composition of SC1 Solution
- New Low Temperature Processing of Sol-Gel SrBi_2Ta_2O_9 Thin Films
- Influence of Buffer Layers and Excess Pb/Zr+Ti Ratios on Fatigue Characteristics of Sol-Gel-Derived Pb(Zr, Ti)O_3 Thin Films
- Preparation of Dielectric Thin Films from Photosensitive Sol-Gel Solution ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Surface Morphology of Lead-Based Thin Films and Their Properties ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Influence of Buffer Layers on Microstructural and Ferroelectric Characteristics of Sol-Gel Derived PbZr_xTiO_3 Thin Films ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Preparation of Pb(Zr,Ti)O_3 Films on Pi/Ti/Ta Electrodes by Sol-Get Process
- Sample Preparation and Photoluminescence of ZnO Particles Embedded in Thin Alkali Halide Crystals
- Nitridation of Gaps (001) Surface Studied by Auger Electron Spectroscopy
- Nitridation of GaAs(001) Surface Studied by Auger Electron Spectroscopy