Nakazato Kazuo | Department of Electrical and Computer Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan

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著作論文

Amperometric Electrochemical Sensor Array for On-Chip Simultaneous Imaging: Circuit and Microelectrode Design Considerations
Significant Reduction of Phonon Scattering Potential in 1D Si Quantum Dot Array Interconnected with Thin Oxide Layers
CMOS Cascode Source-Drain Follower for Monolithically Integrated Biosensor Array
Site Blocking Effect in Tracer Diffusion on a Lattice
Photosystem I Bio-Photosensor Integrated with Complementary Metal–Oxide–Semiconductor Source–Drain Follower on a Chip
On-chip Microelectrode Capacitance Measurement for Biosensing Applications
Phase Shift Formulation of Boundary Conditions in Rarefied Gas Dynamics
Preparation of Various Supramolecular Assemblies and Measurement of Photoresponse Behaviors
Analytical Compact Model of Ballistic Cylindrical Nanowire Metal–Oxide–Semiconductor Field-Effect Transistor
Full Three-Dimensional Simulation of Ion-Sensitive Field-Effect Transistor Flatband Voltage Shifts Due to DNA Immobilization and Hybridization
Complementary Metal–Oxide–Semiconductor Ion-Sensitive Field-Effect Transistor Sensor Array with Silicon Nitride Film Formed by Catalytic Chemical Vapor Deposition as an Ion-Sensitive Membrane
Analytic Compact Model of Ballistic and Quasi-Ballistic Cylindrical Gate-All-Around Metal--Oxide--Semiconductor Field Effect Transistors Including Two Subbands
Analytic Circuit Model of Ballistic Nanowire Metal--Oxide--Semiconductor Field-Effect Transistor for Transient Analysis
Three-Dimensional Simulation of DNA Sensing by Ion-Sensitive Field-Effect Transistor: Optimization of DNA Position and Orientation
Three-Dimensional Simulation of DNA Sensing by Ion-Sensitive Field-Effect Transistor : Optimization of DNA Position and Orientation (Special Issue : Solid State Devices and Materials)
Analytic Circuit Model of Ballistic Nanowire Metal-Oxide-Semiconductor Field-Effect Transistor for Transient Analysis (Special Issue : Solid State Devices and Materials)

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