Sawada Takayuki | Research Center For Interface Quantum Electronics Hokkaido University

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概要

• 同名の論文著者
• Research Center For Interface Quantum Electronics Hokkaido Universityの論文著者

関連著者

• HASEGAWA Hideki

  Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University

• SAWADA Takayuki

  Research Center for Interface Quantum Electronics, Hokkaido University

• Sawada Takayuki

  Research Center For Interface Quantum Electronics Hokkaido University

• SAITOH Toshiya

  Research Center for Interface Quantum Electronics, Hokkaido University

• Saitoh T

  Semiconductor Device Group Advanced Devices Development Center Matsushita Electric Industrial Co. Lt

• Saitoh Toshiya

  Research Center For Interface Quantum Electronics Hokkaido University

• Hasegawa Hideki

  Research Center for Integrated Quantum Electronics (RCIQE) and Graduate School of Information Science and Technology, Hokkaido University, North 13, West 8, Kita-ku, Sapporo 060-8628, Japan

• HASHIZUME Tamotsu

  Hokkaido University

• HARTNAGEL Hans

  Institut fur Hochfrequenztechnik, Fachbereich Elektrotechnik und Informationstechnik, TU Darmstadt

• Hashizume Tamotsu

  Hokkaido Polytechnic College

• NUMATA Kei-ich

  (Present address) Microelectronics Research Laboratories, NEC Corporation

• TOHDOH Susumu

  Research Center for Interface Quantum Electronics, Hokkaido University

• NISHIMOTO Youichiro

  Department of Electrical Engineering, Hokkaido University

• Tohdoh Susumu

  Research Center For Interface Quantum Electronics Hokkaido University

• Numata Kei-ich

  (present Address) Microelectronics Research Laboratories Nec Corporation

• Hartnagel H

  Th Darmstadt Darmstadt Deu

• Hartnagel Hans

  Institut Fur Hochfrequenztechnik Fachbereich Elektrotechnik Und Informationstechnik Tu Darmstadt

• GRUB Andreas

  Institut fur Hochfrequentztechnik, Technische Hochschule Darmstadt

• Grub Andreas

  Institut Fur Hochfrequentztechnik Technische Hochschule Darmstadt

• Nishimoto Youichiro

  Department Of Electrical Engineering Hokkaido University

• HARTNAGEL Hans

  Institut fur Hochfrequentztechnik, Technische Hochschule Darmstadt

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著作論文

• In-Situ Characterization of Compound Semiconductor Surfaces by Novel Photoluminescence Surface State Spectroscopy
• A Novel Contactless and Nondestructive Measurement Method of Surface Recombination Velocity on Silicon Surfaces by Photoluminescence
• Deep Level Characterization of Submillimeter-Wave GaAs Schottky Diodes Produced by a Novel In-Situ Electrochemical Process

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