TAKAYANAGI Mariko | Advanced CMOS Technology Dept., Center for Semiconductor Research & Development, Semiconductor Compa
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概要
- 同名の論文著者
- Advanced CMOS Technology Dept., Center for Semiconductor Research & Development, Semiconductor Compaの論文著者
関連著者
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TAKAYANAGI Mariko
Advanced CMOS Technology Dept., Center for Semiconductor Research & Development, Semiconductor Compa
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Ishihara Takamitsu
Advanced Lsi Technology Laboratory Corporate Research & Development Center
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Takayanagi Mariko
Advanced Cmos Technology Dept. Center For Semiconductor Research & Development Semiconductor Com
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ISHIHARA Takamitsu
Advanced LSI Technology Laboratory, Research and Development Center, Toshiba Corporation
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Matsuzawa Kazuya
Semiconductor Technology Academic Research Center (starc)
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Matsuzawa Kazuya
Advanced Lsi Technology Laboratory Research & Development Center Toshiba Corporation
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Matsuzawa Kazuya
Advanced Lsi Technology Laboratory Corporate Research & Development Center Toshiba Corporation
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Tanimoto Hiroyoshi
Advanced Cmos Technology Dept. Center For Semiconductor Research & Development Semiconductor Com
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Takagi Shin-ichi
Advanced Lsi Technology Laboratory Research & Development Center Toshiba Corporation
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Koyama Masato
Advanced Lsi Technology Laboratory Corporate R & D Center Toshiba Corporation
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Iijima Ryosuke
Advanced Lsi Technology Laboratory Corporate R&d Center Toshiba Corporation
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Iijima Ryosuke
Advanced Lsi Technology Laboratory Corporate Research & Development Center
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Ishihara T
Hyogo Prefectural Institute Of Industrial Research
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Takayanagi Mariko
System Lsi Research & Development Center Semiconductor Company Toshiba Corporation
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Takagi Shin-ichi
Advanced Lsi Technology Laboratory Corporate Research & Development Center Toshiha Corporation
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Takayanagi Mariko
Semiconductor Company Toshiba Corporation
著作論文
- Study on Carrier Transport Limited by Coulomb Scattering due to Charged Centers in HfSiON MISFETs
- Comprehensive Understanding of Electron and Hole Mobility Limited by Surface Roughness Scattering in Pure Oxides and Oxynitrides Based on Correlation Function of Surface Roughness