Lee Choong-ho | Device Research Team R&d Center Samsung Electronics
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概要
関連著者
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Park Donggun
Device Research Team
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Lee Choong-ho
Device Research Team R&d Center Samsung Electronics
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PARK Donggun
Device Research Team, R&D Center, Samsung Electronics Co.
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LEE Choong-Ho
Device Research Team, R&D Center, Samsung Electronics
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Lee Jong
School Of Adv. Mat. Sci. & Eng. Sungkyunkwan Univ.
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Han Jin-woo
Dept. Of Eecs Korea Advanced Institute Of Science And Technology
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Choi Yang-kyu
Dept. Of Eecs Korea Advanced Institute Of Science And Technology
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Shin Hyungcheol
School Of Electrical Engineering And Computer Science Seoul National University
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Park Seung
Device Research Team R&d Center Samsung Electronics
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Park Donggun
Device Research Team Semiconductor R&d Division Samsung Electronics Co.
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LEE Chul
Device Research Team, Semiconductor R&D Center, Samsung Electronics
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KIM Keunnam
Device Research Team, Semiconductor R&D Center, Samsung Electronics
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KIM Keunnam
Advanced Technology Development Team
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LEE Chul
Advanced Technology Development Team
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PARK Donggun
Advanced Technology Development Team
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YOON Jae-man
Device Research Team, R&D Center, Samsung Electronics
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KANG Hee
Device Research Team, R&D Center, Samsung Electronics
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AHN Young
Device Research Team, R&D Center, Samsung Electronics
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CHO Eun
Device Research Team
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Yoon Jae-man
Device Research Team R&d Center Samsung Electronics
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Ahn Young
Device Research Team R&d Center Samsung Electronics
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Lee Choong-ho
Device Research Team Semiconductor R&d Division Samsung Electronics Co.
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Choi Byung
School Of Chemical Engineering Seoul National University
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Kang Hee
Device Research Team R&d Center Samsung Electronics
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Lee Yong
Depart. Of Oncology Yonsei Univ. Wonju College Of Medicine
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Choi Byung
School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Shinlim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Kim Dong-Won
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Cho Eun
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Sung Suk-Kang
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Park Byung-Gook
School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Shinlim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Cho Byung
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Choi Woo
School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Shinlim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Kim Tae-Yong
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Bai Keun
Process Development Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Kim Dong-Dae
Test Engineering Team, Memory Division, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Bai Keun
Process Development Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Kim Tae-Yong
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Park Byung-Gook
School of Electrical Engineering & Inter-University Semiconductor Research Center (ISRC), Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Republic of Korea
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Park Donggun
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Lee Choong-Ho
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Ri, Giheung-Eup, Youngin-City, Gyeonggi-Do 449-711, Korea
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Shin Hyungcheol
School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Shinlim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Shin Hyungcheol
School of Electrical Eng.
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Park Byung-Gook
School of EECS and ISRC, Seoul National University, Seoul 151-742, Korea
著作論文
- Optimization of Layout and Doping Profile Design for BT(Body Tied)-FinFET DRAM
- A Comprehensive Study of Hot-Carrier Effects in Body-Tied FinFETs
- Highly Manufacturable and Reliable 80-nm Gate Twin Silicon–Oxide–Nitride–Oxide–Silicon Memory Transistor