Han Jin-woo | Dept. Of Eecs Korea Advanced Institute Of Science And Technology
スポンサーリンク
概要
関連著者
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Han Jin-woo
Dept. Of Eecs Korea Advanced Institute Of Science And Technology
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Choi Yang-kyu
Dept. Of Eecs Korea Advanced Institute Of Science And Technology
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Kim Kuk-Hwan
Dept. of EECS, Korea Advanced Institute of Science and Technology
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PARK Donggun
Device Research Team, R&D Center, Samsung Electronics Co.
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Kim Kuk-hwan
Dept. Of Eecs Korea Advanced Institute Of Science And Technology
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Park Donggun
Device Research Team Semiconductor R&d Division Samsung Electronics Co.
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Park Donggun
Device Research Team
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Han Jin-Woo
Dept. of EECS, Korea Advanced Institute of Science and Technology
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Choi Yang-Kyu
Dept. of EECS, Korea Advanced Institute of Science and Technology
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LEE Choong-Ho
Device Research Team, R&D Center, Samsung Electronics
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Lee Choong-ho
Device Research Team R&d Center Samsung Electronics
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Lee Choong-ho
Device Research Team Semiconductor R&d Division Samsung Electronics Co.
著作論文
- Investigation of Gate Misalignment Effects in FinFETs(Session 7A Silicon Devices IV,AWAD2006)
- Investigation of Gate Misalignment Effects in FinFETs(Session 7A Silicon Devices IV,AWAD2006)
- A Comprehensive Study of Hot-Carrier Effects in Body-Tied FinFETs
- A Comprehensive Study of Hot-Carrier Behaviors with Consideration of Non-Local, Series Resistance, Quantum, and Temperature Effects in Multi-Gate FinFETs