YOUNG C. | SEMATECH
スポンサーリンク
概要
関連著者
-
Lee B.
Ibm Assignees
-
SONG S.
SEMATECH
-
BERSUKER G.
SEMATECH
-
CHOI R.
SEMATECH
-
YOUNG C.
SEMATECH
-
PARK H.
Samsung Assignee
-
KANG C.
SEMATECH
-
Sim J.
Sematech
-
HEH D.
SEMATECH
-
HWANG H.
GIST
-
KIRSCH P.
IBM Assignees
-
JAMMY R.
IBM Assignees
-
CHOI Rino
SEMATECH
-
PARK H.
Gwanju Institute of Science and Technology
-
LEE B.
SEMATECH
-
PARK H.
SEMATECH
-
HWANG H.
Gwangju Institute of Science and Technology
-
SIVASUBRAMANI P.
SEMATECH
-
LICHTENWALNER J.
Dept. of Materials Science and Engineering, North Carolina State University
-
JUR J.
Dept. of Materials Science and Engineering, North Carolina State University
-
KINGON A.
Dept. of Materials Science and Engineering, North Carolina State University
-
BAE S.
Microelectronics Research Center, Department of Electrical and Computer Engineering
-
HUSSAIN M.
SEMATECH
-
LEE B.
The University of Texas
-
Jur J.
Dept. Of Materials Science And Engineering North Carolina State University
-
Kingon A.
Dept. Of Materials Science And Engineering North Carolina State University
-
Lichtenwalner J.
Dept. Of Materials Science And Engineering North Carolina State University
-
Bae S.
Microelectronics Research Center Department Of Electrical And Computer Engineering
著作論文
- A novel inversion pulse measurement technique to investigate transient charging characteristics in high-k NMOS transistors
- Physical Origin of Fast Transient Charging in Hafnium Based Gate Dielectrics
- nMOSFET Reliability Improvement attributed to the Interfacial Dipole formed by La Incorporation in HfO_2
- Effects of Optimization of Gate Edge Profile on sub-45nm Metal Gate High-k Dielectric Metal-Oxide-Semiconductor Field Effect Transistors Characteristics