Song Yunheub | Department Of Electronics Engineering Chungnam National University
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概要
関連著者
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Song Yunheub
Department Of Electronics Engineering Chungnam National University
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KIM Dae
Korea institute for Advanced Study
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Han In-Shik
Dept. of Electronics Engineering, Chungnam National University
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GOO Tae-Gyu
Dept. of Electronics Engineering, Chungnam National University
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LEE Heui-Seung
Magnachip Semiconductor Inc.
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LEE Hi-Deok
Department of Electronics Engineering, Chungnam National University
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Lee H‐j
Dept. Of Electronics Engineering Chungnam National University
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Lee Hi-deok
R&d Division Lg Semicon Co. Ltd.
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Lee Hi-deok
Department Of Electronics Engineering Chungnam National University
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Lee H‐j
Magnachip Semiconductor Inc.
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Han In-shik
Dept. Of Electronics Engineering Chungnam National University
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KIM Bomsoo
Korea Institute for Advanced Study
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BAEK Chang-Ki
Korea Institute for Advanced Study
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SONG Youngsun
Memory Business, Samsung Electronics Co., Ltd.
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KANG Myounggon
Memory Business, Samsung Electronics Co., Ltd.
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SON Younghwan
Department of Electronics Engineering, Chungnam National University
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HAN In-Shik
Department of Electronics Engineering, Chungnam National University
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GOO Tae-Gyu
Department of Electronics Engineering, Chungnam National University
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Kim Dae
Magnachip Semiconductor Inc.
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Lee H‐d
Chungnam National Univ. Taejon Kor
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Han In-shik
Department Of Electronics Engineering Chungnam National University
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Kim Dae
Korea Atomic Energy Research Institute
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Park Ki-tae
Memory Business Samsung Electronics Co. Ltd.
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Kim D
Korea Institute For Advanced Study
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Kim Dae-byung
Dept. Of Materials Engineering Korea University Of Technology And Education
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Son Younghwan
Department Of Electronics Engineering Chungnam National University
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Goo Tae-gyu
Dept. Of Electronics Engineering Chungnam National University
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Kim Changhyun
Memory Division Samsung Electronics Co. Ltd.
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Choi Byung
Memory R&D Center, Memory Business, Samsung Electronics Co., Ltd., San #14, Banwol-dong, Hwasung, Kyunggi-do 445-701, Korea
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Song Youngsun
Memory R&D Center, Memory Business, Samsung Electronics Co., Ltd., San #14, Banwol-dong, Hwasung, Kyunggi-do 445-701, Korea
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Hwang Soonwook
Memory R&D Center, Memory Business, Samsung Electronics Co., Ltd., San #14, Banwol-dong, Hwasung, Kyunggi-do 445-701, Korea
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Lee Yeong-Taek
Memory R&D Center, Memory Business, Samsung Electronics Co., Ltd., San #14, Banwol-dong, Hwasung, Kyunggi-do 445-701, Korea
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Song Yunheub
Department of Electronics and Communications Engineering, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Korea
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Song Yunheub
Department of Electronics and Computer Engineering, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Korea
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Lee Yeong-Taek
Memory R&D Center, Memory Business, Samsung Electronics Co., Ltd., San #14, Banwol-dong, Hwasung, Kyunggi-do 445-701, Korea
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Park Ki-Tae
Memory R&D Center, Memory Business, Samsung Electronics Co., Ltd., San #14, Banwol-dong, Hwasung, Kyunggi-do 445-701, Korea
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Kang Myounggon
Memory R&D Center, Memory Business, Samsung Electronics Co., Ltd., San #14, Banwol-dong, Hwasung, Kyunggi-do 445-701, Korea
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Hwang Soonwook
Memory R&D Center, Memory Business, Samsung Electronics Co., Ltd., San #14, Banwol-dong, Hwasung, Kyunggi-do 445-701, Korea
著作論文
- Near Surface Oxide Trap Density Profiling in NO and Remote Plasma Nitrided Oxides in Nano-Scale MOSFETs, Using Multi-Temperature Charge Pumping Technique : N_ vs. Oxide Processing
- Improving Read Disturb Characteristics by Self-Boosting Read Scheme for Multilevel NAND Flash Memories