Shimamoto H | Musashino Office Hitachi Device Engineering Co. Ltd.
スポンサーリンク
概要
関連著者
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SHIMAMOTO Hiromi
Musashino Office, Hitachi Device Engineering, Co., Ltd.
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WASHIO Katsuyoshi
Central Research Laboratory, Hitachi, Ltd.
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Shimamoto H
Musashino Office Hitachi Device Engineering Co. Ltd.
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Shimamoto Hiromi
Musashino Office Hitachi Device Engineering Co. Ltd.
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Washio K
Central Research Laboratory Hitachi Ltd.
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Washio Katsuyoshi
Central Research Laboratory Hitachi Ltd.
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TANABE Masamichi
Musashino Office, Hitachi Device Engineering, Co., Ltd.
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Tanabe Masamichi
Musashino Office Hitachi Device Engineering Co. Ltd.
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OHUE Eiji
Central Research Laboratory, Hitachi, Ltd.
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Ohue Eiji
Central Research Laboratory Hitachi Ltd.
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Ohue E
Central Research Laboratory Hitachi Ltd.
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ONAI Takahiro
Central Research Laboratory, Hitachi, Ltd.
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Nakamura T
Fujitsr Ltd. Akiruno-shi Jpn
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NAKAMURA Tohru
Central Research Laboratory, Hitachi, Ltd.
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Onai T
Central Research Laboratory Hitachi Ltd.
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Onai Takahiro
Central Research Laboratory Hitachi Ltd.
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Nakamura Tohru
Central Research Lab. Hitachi Ltd.
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Kiyota Yukihiro
Central Research Laboratory, Hitachi Ltd.
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Kiyota Yukihiro
Central Research Laboratory Hitachi Ltd.
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Kiyota Yukihiro
Central Research Laboratory Hitachi
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Oda K
Telecom Engineering Center
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Oda Katsuya
Central Research Laboratory Hitachi Ltd.
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Hashimoto Takashi
Device Development Center, Hitachi, Ltd.
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UDO Tsutomu
Hitachi ULSI Systems Co., Ltd.
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KODAMA Akihiro
Musashino Office, Hitachi Device Engineering Co., Ltd.
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HAYAMI Reiko
Central Research Laboratory, Hitachi, Ltd.
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Udo Tsutomu
Hitachi Ulsi Systems Co. Ltd.
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Hayami Reiko
Central Research Laboratory Hitachi Ltd.
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Kodama Akihiro
Musashino Office Hitachi Device Engineering Co. Ltd.
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Hashimoto Takashi
Device Development Center Hitachi Ltd.
著作論文
- Test Structure and Experimental Analysis of Emitter-Base Reverse Voltage Stress Degradation in Self-Aligned Bipolar Transistors (Special Issue on Microelectronic Test Structure)
- High-Speed High-Density Self-Aligned PNP Technology for Low-Power Complementary Bipolar ULSIs
- High-Frequency, Low-Noise Si Bipolar Transistor Fabricated Using Self-Aligned Metal/IDP Technology (Special Issue on High-Frequency/speed Devices in the 21st Century)
- HCI-Free Selective Epitaxial SiGe Growth by LPCVD for 80-GHz BiCMOS Production
- DC and AC Performances in Selectively Grown SiGe-Base HBTs (Special Issue on High-Frequency/speed Devices in the 21st Century)