Lee Nae-in | Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology:semiconducto
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概要
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- 同名の論文著者
- Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology:semiconductoの論文著者
関連著者
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Lee Nae-in
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology:semiconducto
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Han C‐h
Department Of Materials Engineering Hanyang University
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Lee J‐w
Hanyang Univ. Seoul Kor
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Lee J‐w
Samsung Electronics Co. Ltd. Kyungki‐do Kor
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Lee J‐w
Technology Development Semiconductor R&d Center Samsung Electronics Co.
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Han C‐h
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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HAN Chul-Hi
Department of Electrical Engineering, Korea Advanced Institute of Science and Technology
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Lee Jin-woo
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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Han Chul-hi
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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Lee Jin-woo
Department Of Dermatology Kosin University College Of Medicine
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Lee Jin-woo
Department Of Biomedical Engineering College Of Medicine Kyunghee University
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Kim H‐s
Sung Kyun Kwan Univ. Suwon Kor
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Kim H‐s
Hynix Semiconductor Inc. Kyoungki‐do Kor
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LEE Nae-In
Semiconductor R & D Center, Samsung Electronics Co. Ltd.
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KIM Hyoung-Sub
Semiconductor R & D Center, Samsung Electronics Co. Ltd.
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HUR Sung-Hoi
Department of Electrical Eingineering, Korea Advenced Institute of Science and Technology
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Hur Sung-hoi
Department Of Electrical Eingineering Korea Advenced Institute Of Science And Technology
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Lee Jin-Woo
Dept. of Electrical Eng., Korea Univ.
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Lee Jin-woo
Dept. Biotechnology Dong-a Univ.:bk21 Bio-silver Project Of Dong-a Univ.
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Ahn Sung
Advanced Technology Center Samsung Electronics Co. Ltd.
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Lee N‐i
Korea Advanced Inst. Sci. And Technol. Taejon Kor
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LEE Nae-In
Advanced Technology Center, Samsung Electronics Co. Ltd.
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KIM Young-Wug
Advanced Technology Center, Samsung Electronics Co. Ltd.
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LEE Nae-In
Dept. of E. E., KAIST
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HAN Chul-Hi
Dept. of E. E., KAIST
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KIM Hyoung-Sub
Department of Electrical Engineering, KAIST
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Lee Nae-in
Advanced Process & Development Team System Lsi Division & 3technology & Development Team
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Kim Young-wug
Advanced Technology Center Samsung Electronics Co. Ltd.
著作論文
- Effect of the Silicidation Reaction Condition on the Gate Oxide Integrity in Ti-polycide Gate
- Endurance Characteristics and Degradation Mechanism of Polysilicon Thin Film Transistor EEPROMs with Electron Cyclotron Resonance N_2O-Plasma Gate Oxide
- High-Performance EEPROMs Using N- and P-Channel Poly-Si TFTs with ECR N2O-Plasma Oxide
- Effect of Bottom Polysilicon Doping on the Reliability of Interpoly Oxide Grown Using Electron Cyclotron Resonence N_2O-Plasma
- Short Channel Effects in N- and P-Channel Polycrystalline Silicon Thin Film Transistors with Very Thin Electron Cyclotron Resonance N_2O-Plasma Gate Dielectric
- Short-Channel Effects in N- and P-Channel Polysilicon Thin Film Transistors with Very Thin ECR N_2O-Plasma Gate Dielectrics
- Highly Reliable Interpoly Oxide Using ECR N_2O-Plasma for Next Generation Flash Memory