Ahn Sung | Advanced Technology Center Samsung Electronics Co. Ltd.
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概要
関連著者
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Ahn Sung
Advanced Technology Center Samsung Electronics Co. Ltd.
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Ahn S
Samsung Electronics Co. Ltd. Kyungki‐do Kor
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Lee Nae-in
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology:semiconducto
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Lee N‐i
Korea Advanced Inst. Sci. And Technol. Taejon Kor
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LEE Nae-In
Advanced Technology Center, Samsung Electronics Co. Ltd.
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KIM Young-Wug
Advanced Technology Center, Samsung Electronics Co. Ltd.
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Park T‐s
Yonsei Univ. Seoul Kor
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Lee Nae-in
Advanced Process & Development Team System Lsi Division & 3technology & Development Team
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Ahn S
Sun Moon Univ. Chung‐nam Kor
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Kim Young-wug
Advanced Technology Center Samsung Electronics Co. Ltd.
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PARK Tai-su
Advanced Technology Center, Samsung Electronics Co., LTD.
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AHN Seong
Advanced Technology Center, Samsung Electronics Co., LTD.
著作論文
- Effect of the Silicidation Reaction Condition on the Gate Oxide Integrity in Ti-polycide Gate
- A Novel LOCal Oxidation of Silicon (LOCUS)-Type Isolation Technology Free of the Field Oxide Thinning Effect