Kawado Seiji | Sony Corporation Research Center
スポンサーリンク
概要
関連著者
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Kawado Seiji
Sony Corporation Research Center
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Ishikawa T
Riken Harima Institute
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Kojima S
Univ. Tsukuba Ibaraki Jpn
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Kawado Seiji
Environment & Analysis Technology Department Technical Support Center Sony Corporation
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Ishikawa T
National Space Dev. Agency Of Japan Ibaraki Jpn
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KOJIMA Shigeru
Sony Corporation Research Center
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Ishikawa Tetsuya
Riken Harima Institute
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ISHIKAWA Tetsuya
Faculty of Engineering, The University of Tokyo
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Liu Kuang-yu
Environment & Analysis Technology Department Technical Support Center Sony Corporation
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Kikuta Seishi
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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Kikuta Seishi
Institute For Solid State Physics University Of Tokyo
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Kawasaki S
Lnstitute For Chemical Research Kyoto University
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Ishikawa T
Kyushu Univ. Fukuoka Jpn
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KUDO Yoshihiro
Sony Corporation Research Center
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Kudo Yoshihiro
Environment & Analysis Technology Department Technical Support Center Sony Corporation
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Ishikawa Tomonori
Fujitsu Limited
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Ishikawa Takatoshi
Department Of Applied Physics Faculty Of Science Fukuoka University
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Kaito Shinji
Research Reactor Institute Kyoto University
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Kikuta S
Univ. Tokyo Tokyo
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Kitao Shinji
Research Reactor Institute Kyoto University
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Kudo Y
Environment & Analysis Technology Department Technical Support Center Sony Corporation
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LIU Kuang
Sony Corporation Research Center
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HAYAFUJI Yoshinori
SONY CORPORATION Research Center
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Kudo Yuki
Faculty Of Technology Tokyo Universily Of Agriculture And Technology
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MORITA Etsuo
Sony Corporation Research Center
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ISHII Zensho
SONY CORPORATION Research Center
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Mitsui T
Crest Japan Science And Technology Agency:japan Atomic Energy Agency
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ISHIKAWA Tetsuya
Photon Factory, National Laboratory for High Energy Physics
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KIKUTA Seishi
Department of Applied Physics, Faculty of Engineering, University of Tokyo
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MATSUSHITA Tadashi
Photon Factory, National Laboratory for High Energy Physics (KEK)
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Kawado Seiji
Sony Corporation Research Laboratory
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LIU Kuang-Yu
Sony Corporation Research Center
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TAKAHASHI Toshio
The Institute for Solid State Physics, The University of Tokyo
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Adachi Tohru
Sony Corporation Research Center
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Kikuta Seishi
Department Of Applied Physics Faculty Of Engieering University Of Tokyo
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Takahashi Teruo
Department Of Organic And Polymeric Materials Tokyo Institute Of Technology
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Takahashi Tetsuo
National Institute Of Advanced Industrial Science And Technology Power Electronics Research Center
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Taguchi Tomohiro
Department Of Organic Materials Tokyo Institute Of Technology
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KASAHARA Jiro
Sony Corporation Research Center
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Matsushita Tadashi
Photon Factory National Laboratory For High Energy Physics
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Kasahara Jiro
Sony Corporation Materials Laboratory
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Takahashi T
Japan Advanced Institute Of Science And Technology
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Matsushita T
Department Of Research And Development Nichia Chemical Industries Ltd
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YANADA Tetsunosuke
SONY Corporation Research Center
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Takahashi Toshio
The Institute For Solid State Physics The University Of Tokyo
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Ishikawa Tetsuya
Photon Factory National Laboratory For High Energy Physics
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ISHIKAWA Tetsuya
Faculty of Engineering, University of Tokyo
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Maruyama Toshiyuki
SONY CORPORATION, Research Laboratory, Hodogaya-ku, Yokohama
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Kawado Seiji
SONY CORPORATION, Research Laboratory, Hodogaya-ku, Yokohama
著作論文
- Measurement of Local Lattice Distortion in Silicon by Imaging-Plate Plane-Wave X-Ray Topography with Image Magnification
- Time-Resolved X-Ray Diffraction Measurement of Silicon Surface during Laser Irradiation under Grazing-Incidence Conditions
- Novel Analysis System of Imaging-Plate Plane-Wave X-Ray Topography for Characterizing Lattice Distortion in Silicon
- Time-Resolved X-Ray Diffraction from a Silicon Crystal Irradiated by a Q-Switched Nd:YAG Laser : Condensed Matter
- Observation of Lattice Defects in Silicon by Scanning Electron Microscopy Utilizing Beam Induced Current Generated in Schottky Barriers
- Transmission Electron Microscopic Observation of Microdefectsin Zn^+ : Implanted GaAs
- Knoop Hardness of Phosphorus-Diffused Silicon Single Crystals
- X-Ray Observation of Dislocations in Mn-Zn Ferrite
- Influence of Preoxidation Annealing on Stacking Fault Generation Due to Mechanical Damage on Silicon Surfaces
- Formation of Gallium Nitride at the Interface between Silicon Nitride Encapsulant and Ion Implanted GaAs
- X-Ray Topographic Images of Oxidation-Induced Frank Sessile Dislocation Loops in Thin Silicon
- Structural Change of Oxidation-Induced Frank Sessile Dislocation Loops in Silicon
- Scanning Electron Microscopic Observation of Oxidation-Induced Stacking Faults in Silicon
- X-ray Observation of Conversion of Faulted Loops to Prismatic Loops in Silicon
- Control of Oxidation-Induced Stacking Faults in Silicon by Chlorine Implantation
- X-Ray Observation of Magnetic Domain in Mn-Ferrite