HAYAFUJI Yoshinori | SONY CORPORATION Research Center
スポンサーリンク
概要
関連著者
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HAYAFUJI Yoshinori
SONY CORPORATION Research Center
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Kawado Seiji
Sony Corporation Research Center
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ADACHI Hirohiko
Department of materials science and engineering, Kyoto University
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Adachi Tohru
Sony Corporation Research Center
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ISHII Zensho
SONY CORPORATION Research Center
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Adachi Hirohiko
Department Of Metallurgy Faculty Of Engineering Kyoto University
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Kimura Hitoshi
Sony Corporation Research Center, Yokohama Technology Center
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Imanaga Syunji
Sony Corporation Research Center, Yokohama Technology Center
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Imanaga S
Sony Corp. Kanagawa Jpn
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Imanaga Syunji
Sony Corporation Frontier Science Laboratories
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Hayafuji Y
Sony Corporation Research Center Yokohama Technology Center
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Adachi Hirohiko
Department Of Chemistry Hyogo University Of Teacher Education
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Kimura Hitoshi
Sony Corporation Research Center Yokohama Technology Center
著作論文
- Observation of Lattice Defects in Silicon by Scanning Electron Microscopy Utilizing Beam Induced Current Generated in Schottky Barriers
- Knoop Hardness of Phosphorus-Diffused Silicon Single Crystals
- The Electronic Structure of One-Dimensional (1-D), 2-D, and 3-D Silicon Clusters