Suzuki Toshi-kazu | Center For Nano Materials And Technology Japan Advanced Institute Of Science And Technology (jaist)
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概要
- Suzuki Toshi-kazuの詳細を見る
- 同名の論文著者
- Center For Nano Materials And Technology Japan Advanced Institute Of Science And Technology (jaist)の論文著者
関連著者
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Suzuki Toshi-kazu
Center For Nano Materials And Technology Japan Advanced Institute Of Science And Technology (jaist)
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Akabori Masashi
Center For Nano Materials And Technology Japan Advanced Institute Of Science And Technology (jaist)
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SHIH Hong-An
Center for Nano Materials and Technology, Japan Advanced Institute of Science and Technology (JAIST)
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Kudo Masahiro
Center For Nano Materials And Technology Japan Advanced Institute Of Science And Technology (jaist)
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Suzuki Toshi-kazu
Japan Advanced Institute Of Science And Technology (jaist)
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Shih Hong‐an
Center For Nano Materials And Technology Japan Advanced Institute Of Science And Technology (jaist)
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AKABORI Masashi
Center for Nano Materials and Technology, Japan Advanced Institute of Science and Technology (JAIST)
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KUDO Masahiro
Center for Nano Materials and Technology, Japan Advanced Institute of Science and Technology (JAIST)
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KAWAI Hiroji
Powdec K.K
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Jeong Yonkil
Center For Nano Materials And Technology Japan Advanced Institute Of Science And Technology (jaist)
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TANIGUCHI Satoshi
Sony Corporation
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ONO Hideki
Advanced Devices R&D Department, Micro Systems Network Company, Sony Corporation
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TANIGUCHI Satoshi
Advanced Devices R&D Department, Micro Systems Network Company, Sony Corporation
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SHINDO Masanori
Center for Nano Materials and Technology, Japan Advanced Institute of Science and Technology (JAIST)
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Shindo Masanori
Center For Nano Materials And Technology Japan Advanced Institute Of Science And Technology (jaist)
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Sumida Yasunobu
POWDEC K.K., 1-23-15 Wakagi-cho, Oyama, Tochigi 323-0028, Japan
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Ono Hideki
Advanced Devices R&D Department, Micro Systems Network Company, Sony Corporation, 4-14-1 Asahi-cho, Atsugi-shi, Kanagawa 243-0014, Japan
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Taniguchi Satoshi
Advanced Devices R&D Department, Micro Systems Network Company, Sony Corporation, 4-14-1 Asahi-cho, Atsugi-shi, Kanagawa 243-0014, Japan
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Tanaka Nariaki
Center for Nano Materials and Technology, Japan Advanced Institute of Science and Technology (JAIST), 1-1 Asahidai, Nomi, Ishikawa 923-1292, Japan
著作論文
- Narrow-gap III-V semiconductor technology : lattice-mismatched growth and epitaxial lift-off for heterogeneous integration(Session1: Compound Semiconductor Devices)
- Indium Content Dependence of Electron Velocity and Impact Ionization in InAlAs/InGaAs Metamorphic HEMTs
- Epitaxial Lift-Off of InGaAs/InAlAs Metamorphic High Electron Mobility Heterostructures and Their van der Waals Bonding on AlN Ceramic Substrates
- Narrow-gap III-V semiconductor technology : lattice-mismatched growth and epitaxial lift-off for heterogeneous integration(Session1: Compound Semiconductor Devices)
- Characterization of sputtered AlN amorphous films and their applications to AlGaN/GaN MIS-HFET
- Delay Time Analysis of AlGaN/GaN Heterojunction Field-Effect Transistors with AlN or SiN Surface Passivation
- Fabrication and Analysis of AlN/GaAs(001) and AlN/Ge/GaAs(001) Metal-Insulator-Semiconductor Structures (Special Issue : Solid State Devices and Materials (1))
- Application of Sputtering-Deposited AlN Films to Gate Dielectric for AlGaN/GaN Metal-Insulator-Semiconductor Heterojunction Field-Effect Transistor (Special Issue : Solid State Devices and Materials (1))
- Indium Content Dependence of Electron Velocity and Impact Ionization in InAlAs/InGaAs Metamorphic HEMTs
- Temperature dependence of frequency dispersion in C-V characteristics of AlN/AlGaN/GaN MIS-HFET