Tabe Michiharu | Research Institute Of Electronics Shizuoka University

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概要

• TABE Michiharuの詳細を見る
• 同名の論文著者
• Research Institute Of Electronics Shizuoka Universityの論文著者

関連著者

• TABE Michiharu

  Research Institute of Electronics, Shizuoka University

• Tabe Michiharu

  Research Institue Of Electronics Shizuoka University

• Tabe Michiharu

  Research Institute Of Electronics Shizuoka University

• 田部 道晴

  静岡大学電子工学研究所

• Nuryadi Ratno

  Research Institute of Electronics, Shizuoka University

• ISHIKAWA Yasuhiko

  Research Institute of Electronics, Shizuoka University

• Tabe M

  Shizuoka Univ. Hamamatsu Jpn

• Nuryadi Ratno

  Research Institue Of Electronics Shizuoka University

• Ishikawa Yasuhiko

  Research Center For Interface Quantum Electronics And Graduate School Of Electronics And Information

• Tabe Michiharu

  Ntt Lsi Laboratories:(present Address)research Institute Of Electronics Shizuoka University

• Zhang Jianhua

  College Of Economics Osaka Prefecture University

• Ishikawa Yasuhiko

  Research Institute Of Electronics Shizuoka University

• LIGOWSKI Maciej

  Research Institute of Electronics, Shizuoka University

• Ichiraku Akihiro

  Research Institute of Electronics, Shizuoka University

• Anwar Miftahul

  Research Institute of Electronics, Shizuoka University

• Jablonski Ryszard

  Division of Sensors and Measuring Systems, Faculty of Mechatronics, Warsaw University of Technology

• TSUCHIYA Toshiaki

  Shimane University

• MAKITA Shigenori

  Research Institute of Electronics, Shizuoka University

• ZHANG Jianhua

  Research Institute of Electronics, Shizuoka University

• Ichiraku Akihiro

  Research Institute Of Electronics Shizuoka University

• Zhang Jianhua

  Research Institute Of Electronics Shizuoka University

• Makita Shigenori

  Research Institute Of Electronics Shizuoka University

• Ligowski Maciej

  Research Institute Of Electronics Shizuoka University

• Tsuchiya Toshiaki

  Shimane Univ.

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著作論文

• Dopant ionization in silicon nanodevices investigated by Kelvin Probe Force Microscope (電子デバイス)
• Thermal Nitridation of Si(111) Surfaces with N_2 Molecules Studied by X-Ray Photoelectron Spectroscopy
• Effects of Electron Tunneling into a Single-Crystalline Si Layer through an Ultrathin Buried Oxide

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