LIGOWSKI Maciej | Research Institute of Electronics, Shizuoka University
スポンサーリンク
概要
関連著者
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田部 道晴
静岡大学電子工学研究所
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TABE Michiharu
Research Institute of Electronics, Shizuoka University
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Tabe Michiharu
Research Institue Of Electronics Shizuoka University
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Tabe Michiharu
Ntt Lsi Laboratories:(present Address)research Institute Of Electronics Shizuoka University
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LIGOWSKI Maciej
Research Institute of Electronics, Shizuoka University
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Ligowski Maciej
Research Institute Of Electronics Shizuoka University
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Nuryadi Ratno
Research Institute of Electronics, Shizuoka University
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Tabe M
Shizuoka Univ. Hamamatsu Jpn
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Nuryadi Ratno
Research Institue Of Electronics Shizuoka University
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Ichiraku Akihiro
Research Institute of Electronics, Shizuoka University
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Anwar Miftahul
Research Institute of Electronics, Shizuoka University
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Jablonski Ryszard
Division of Sensors and Measuring Systems, Faculty of Mechatronics, Warsaw University of Technology
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Ichiraku Akihiro
Research Institute Of Electronics Shizuoka University
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MORARU Daniel
Research Institute of Electronics, Shizuoka University
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YOKOI Kiyohito
Research Institute of Electronics, Shizuoka University
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Yokoi Kiyohito
Research Institute Of Electronics Shizuoka University
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Moraru Daniel
Shizuoka Univ. Hamamatsu Jpn
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Tabe Michiharu
Research Institute Of Electronics Shizuoka University
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MIZUNO Takeshi
Research Institute of Electronics, Shizuoka University
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田部 道晴
静岡大学 電子工学研究所
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Mizuno Takeshi
Research Center Sony Corporation
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Mizuno Takeshi
Shizuoka Univ. Hamamatsu Jpn
著作論文
- Single-Electron Transfer by Inter-Dopant Coupling Tuning in Doped Nanowire Silicon-on-Insulator Field-Effect Transistors
- Dopant ionization in silicon nanodevices investigated by Kelvin Probe Force Microscope (シリコン材料・デバイス)
- Dopant ionization in silicon nanodevices investigated by Kelvin Probe Force Microscope (電子デバイス)