HACHISUKA Atsushi | Renesas Technology Corp.
スポンサーリンク
概要
関連著者
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YAMAZAKI Akira
Renesas Technology
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MORISHITA Fukashi
Renesas Technology Corp.
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HACHISUKA Atsushi
Renesas Technology Corp.
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OZAKI Hideyuki
Renesas Technology Corp.
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Ozaki H
Renesas Technology Corp.
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Ozaki Hideyuki
Ulsi Laboratory Mitsubishi Electric Corporation
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Yamazaki A
Renesas Technology
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YAMAZAKI AKIRA
Neonatal Care Center, Niigata City General Hospital
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Arimoto Kazutami
System Core Technology Div. Renesas Technology Corp.
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Morishita Fukashi
System Core Technology Div. Renesas Technology Corp.
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Morishita Fukashi
Renesas Technology Corporation
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Haraguchi Masaru
Renesas Technol. Itami‐shi Jpn
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Haraguchi Masaru
Department Of Physics Faculty Of Science Osaka University
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Haraguchi Masaru
Department Of Electrical And Electronics Engineering Sophia University
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Haraguchi Masaru
Renesas Technology Corporation
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ARIMOTO Kazutami
Renesas Technology
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WATANABE Naoya
Renesas Technology Corp.
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AMANO Teruhiko
Renesas Technology Corp.
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TAITO Yasuhiko
Renesas Technology Corporation
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Dosaka K
System Core Technology Div. System Solution Business Group Renesas Technology Co.
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帶刀 恭彦
(株)ルネサステクノロジ
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Arimoto Kazutami
Renesas Electronics Corp.
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MORIHARA Toshinori
Renesas Technology
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MOROOKA Yoshikazu
Renesas Technology
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NODA Hideyuki
Renesas Technology Corp.
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DOSAKA Katsumi
Renesas Technology Corp.
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WAKE Setsuo
Renesas Technology Corp.
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YOSHIHARA Tsutomu
Waseda University
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FUJINO Takeshi
Department of Electric and Electronic Engineering, Ritsumeikan University
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KINOSHITA Mitsuya
Renesas Technology Corporation
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HATAKENAKA Makoto
Renesas Technology Corporation
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AMO Atsushi
Renesas Technology Corporation
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Noda H
System Core Technology Div. System Solution Business Group Renesas Technology Co.
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WATANABE Naoya
The authors are with ULSI Development Center, Mitsubishi Electric Corp.
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MORISHITA Fukashi
The authors are with ULSI Development Center, Mitsubishi Electric Corp.
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TAITO Ysuhiko
The authors are with ULSI Development Center, Mitsubishi Electric Corp.
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YAMAZAKI Akira
The authors are with ULSI Development Center, Mitsubishi Electric Corp.
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TANIZAKI Tetsushi
The authors are with ULSI Development Center, Mitsubishi Electric Corp.
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DOSAKA Katsumi
The authors are with ULSI Development Center, Mitsubishi Electric Corp.
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MOROOKA Yoshikazu
The authors are with ULSI Development Center, Mitsubishi Electric Corp.
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IGAUE Futoshi
The author is with Mitsubishi Electric Engineering Co., Ltd.
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FURUE Katsuya
The authors are with System LSI Division, Mitsubishi Electric Corp.
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NAGURA Yoshihiro
The authors are with System LSI Division, Mitsubishi Electric Corp.
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KOMOIKE Tatsunori
The authors are with System LSI Division, Mitsubishi Electric Corp.
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MORIHARA Toshinori
The authors are with System LSI Division, Mitsubishi Electric Corp.
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HACHISUKA Atsushi
The authors are with ULSI Development Center, Mitsubishi Electric Corp.
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ARIMOTO Kazutami
The authors are with ULSI Development Center, Mitsubishi Electric Corp.
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OZAKI Hideyuki
The authors are with ULSI Development Center, Mitsubishi Electric Corp.
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Fujino Takeshi
Wood Research Institute, Kyoto University
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Fujino T
Wood Research Institute Kyoto University
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Fujino Takeshi
Department Of Electric And Electronic Engineering Ritsumeikan University
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Koide Tetsushi
Research Institute For Nanodevice And Bio Systems Hiroshima University
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Koide Tetsushi
Hiroshima Univ. Higashihiroshima‐shi Jpn
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Noda H
Hitachi Ltd. Kokubunji‐shi Jpn
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Dosaka Katsumi
Renesas Electronics Corp. Itami‐shi Jpn
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Igaue Futoshi
The Author Is With Mitsubishi Electric Engineering Co. Ltd.
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Furue Katsuya
The Authors Are With System Lsi Division Mitsubishi Electric Corp.
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Nagura Yoshihiro
The Authors Are With System Lsi Division Mitsubishi Electric Corp.
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Tanizaki Tetsushi
The Authors Are With Ulsi Development Center Mitsubishi Electric Corp.
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Yoshihara Tsutomu
Graduate School Of Information Production And Systems Waseda Univ.
著作論文
- A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros(Integrated Electronics)
- A Low Power Embedded DRAM Macro for Battery-Operated LSIs(Power Optimization)(VLSI Design and CAD Algorithms)
- An Embedded DRAM Hybrid Macro with Auto Signa Management and Enhanced-on-Chip Tester