Characterization of Top-Gate Effects in Amorphous InGaZnO Thin-Film Transistors Using a Dual-Gate Structure

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概要

• 論文の詳細を見る

著者

• Iwamatsu Shinnosuke

  Yamagata Research Institute Of Technology

• WATANABE Yoshiyuki

  Yamagata Research Institute of Technology

• KOBAYASHI Seiya

  Yamagata Research Institute of Technology

• Yahagi Toru

  Yamagata Research Institute of Technology, Yamagata 990-2473, Japan

• Takechi Kazushige

  NLT Technologies, Ltd., Kawasaki 211-8666, Japan

• Tanabe Hiroshi

  NLT Technologies, Ltd., Kawasaki 211-8666, Japan

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