WATANABE Yoshiyuki | Yamagata Research Institute of Technology

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概要

• Watanabe Yoshiyukiの詳細を見る
• 同名の論文著者
• Yamagata Research Institute of Technologyの論文著者

関連著者

• WATANABE Yoshiyuki

  Yamagata Research Institute of Technology

• KOBAYASHI Seiya

  Yamagata Research Institute of Technology

• Iwamatsu Shinnosuke

  Yamagata Research Institute Of Technology

• Yahagi Toru

  Yamagata Research Institute of Technology, Yamagata 990-2473, Japan

• Takechi Kazushige

  NLT Technologies, Ltd., Kawasaki 211-8666, Japan

• Tanabe Hiroshi

  NLT Technologies, Ltd., Kawasaki 211-8666, Japan

• MINETA Takashi

  Yamagata Research Institute of Technology

• Kobayashi S

  Murata Manufacturing Co. Ltd.

• Sato Toshiyuki

  Yamagata Research Institute Of Technology

• Esashi Masayoshi

  New Industry Creation Hatchery Center Tohoku University

• Mitsui Toshiaki

  Yamagata Research Institute Of Technology

• Esashi Masayoshi

  New Industry Creation Hatchery Center Tohoku Univ.

• Haga Yoichi

  Faculty Of Engineering Tohoku University

• Shibata Kenya

  Yamagata Kyowa Electronic Instruments Co. Ltd.

• ABE Yutaka

  Yamagata University

• TAKAHASHI Yoshiyuki

  Yamagata Research Institute of Technology

• Esashi Masayoshi

  New Industry Creation Hatchery Center (niche) Tohoku University

• Abe Yutaka

  Yamagata Research Institute Of Technology

• Kobayashi Seiya

  Yamagata Research Institute of Technology, Yamagata 990-2473, Japan

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著作論文

• The Microassembly Technique for a 3D Single Crystaalline Silicon Structure Using a Polyimide/Chromium Cantilever
• シリコン骨格の能動カテーテル
• Development of an Electromagnetically Driven Optical MEMS Mirror with Functions of Z-Axis Vibration and X, Y Bi-Directional Tilting, and an Application to Low Coherent Optical Interferometer
• Characterization of Top-Gate Effects in Amorphous InGaZnO Thin-Film Transistors Using a Dual-Gate Structure
• Depth-Profiling Study on Amorphous Indium--Gallium--Zinc Oxide Thin-Film Transistors by X-ray Photoelectron Spectroscopy
• Depth-Profiling Study on Amorphous Indium-Gallium-Zinc Oxide Thin-Film Transistors by X-ray Photoelectron Spectroscopy (Special Issue : Active-Matrix Flatpanel Displays and Devices : TFT Technologies and FPD Materials)

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