Experimental Evidence for Involvement of Interface States in Random Telegraph Noise in Junction Leakage Current of MetalOxideSemiconductor Field-Effect Transistor
スポンサーリンク
概要
著者
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Shima Akio
Central Research Laboratory Hitachi Ltd.
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Takeda Kenichi
Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
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Mori Yuki
Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
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Yamada Ren-ichi
Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
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