X-ray Topography Used to Observe Dislocations in Epitaxially Grown Diamond Film (SELECTED TOPICS IN APPLIED PHYSICS : Diamond Semiconductors : from Materials to Devices)
スポンサーリンク
概要
著者
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Umezawa Hitoshi
Diamond Res. Lab, National Inst. of Advanced Industrial Sci.
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Shikata Shinichi
Diamond Res. Lab, National Inst. of Advanced Industrial Sci.
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Kato Yukako
Diamond Research Laboratory, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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Yamaguchi Hirotaka
Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan
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KATO Yukako
Diamond Research Laboratory, National Institute of Advanced Industrial Science and Technology (AIST)
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- X-ray Topography Used to Observe Dislocations in Epitaxially Grown Diamond Film (SELECTED TOPICS IN APPLIED PHYSICS : Diamond Semiconductors : from Materials to Devices)
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